Attention-based Ensemble for Deep Metric Learning
Published in European Conference on Computer Vision(ECCV) 2018, 2018
We propose an ensembling technique for deep metric learning, based on multiple attention-based leaners.
Recommended citation: Kim, W., Goyal, B., Chawla, K., Lee, J., & Kwon, K. (2018). Attention-based Ensemble for Deep Metric Learning. arXiv preprint arXiv:1804.00382. https://arxiv.org/abs/1804.00382